发明名称 Apparatus for controlling the temperature of a gas distribution plate in a process reactor
摘要 A plasma process reactor is disclosed that allows for greater control in varying the functional temperature range for enhancing semiconductor processing and reactor cleaning. The temperature is controlled by splitting the process gas flow from a single gas manifold that injects the process gas behind the gas distribution plate into two streams where the first stream goes behind the gas distribution plate and the second stream is injected directly into the chamber.
申请公布号 US6833049(B2) 申请公布日期 2004.12.21
申请号 US20030651424 申请日期 2003.08.29
申请人 发明人
分类号 C23C16/44;C23C16/455;C23C16/507;H01J37/32;H01L21/00;(IPC1-7):H05H1/00;C23C16/00 主分类号 C23C16/44
代理机构 代理人
主权项
地址