发明名称 |
Method of outputting internal information through test pin of semiconductor memory and output circuit thereof |
摘要 |
A circuit and method for selectively outputting internal information in a semiconductor memory device comprising a test circuit such as a JTAG test circuit. The internal information is selectively output through a test pin of the test circuit during a normal operation mode of the semiconductor memory. The internal information of a semiconductor memory chip is output as either a digital or analog signal without having to add additional package pins.
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申请公布号 |
US6834366(B2) |
申请公布日期 |
2004.12.21 |
申请号 |
US20010957885 |
申请日期 |
2001.09.21 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM NAM-SEOG;LEE KWANG-JIN |
分类号 |
G11C29/00;G01R31/3185;G11C29/48;G11C29/50;(IPC1-7):G01R31/28 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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