| 摘要 |
<p>PURPOSE:To inspect the characteristics of thin film transistors (TRs) without damaging the thin film TRs by providing transparent electrodes, the thin film TRs and source electrode lines on an insulating substrate. CONSTITUTION:The source electrode lines S1, S2-Sn, Sn+1 corresponding to the number of thin film TRs to be connected to the external by individually connecting the source electrodes 6, 7 of respective thin film TRs 2, 3. In case of inspecting the characteristics of the TRs 2, 3 for driving plural picture elements 1, respective source electrode lines S1, S2-Sn, Sn+1 are constituted so that voltage +V for specific inspection is easily impressed, and an ammeter 12 for measuring current flowing into the transparent electrode 1 is easily connected. Thus, the characteristics of the thin film TRs can be inspected without damaging the TRs.</p> |
