发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having high reliability without infiltration of moisture of an external atmosphere into a hermetically sealed semiconductor element. SOLUTION: A semiconductor device 10 includes an insulating base 1 having a recess part 1a formed to house a semiconductor element 3 on an upper surface, wiring conductors 2 formed from the inner surface of the recess 1a to at least one of the side face and the lower surface of the insulating base 1, the semiconductor element 3 placed on the bottom of the recess 1a of the insulating base 1 with an electrode 4 electrically connected to the wiring conductors 2, and a cover 5 mounted on the upper surface of the insulating base 1 covering the recess 1a by a resin adhesive 7. The exposed surface out of the resin adhesive 7 is covered with a water repellent resin layer 8. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004356346(A) 申请公布日期 2004.12.16
申请号 JP20030151619 申请日期 2003.05.28
申请人 KYOCERA CORP 发明人 HASEGAWA TAKESHI
分类号 H01L23/02;H01L23/10;(IPC1-7):H01L23/02 主分类号 H01L23/02
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