发明名称 METHOD OF SETTING MEASURING RANGE OF RECIPROCAL LATTICE MAP
摘要 <p><P>PROBLEM TO BE SOLVED: To prevent setting of a warped measuring region, by converting an absolute-angle-designated range into a relative-angle-designated range, when setting a measurement range of a reciprocal lattice map. <P>SOLUTION: The reciprocal lattice map measurement of X-ray diffraction requires setting of the measuring range of 2θ/ωand setting of the measuring range ofω. When the measuring range ofωis designated in absolute angle, it is converted into the relative-angle-designated range to be acquired. For the measuring range of 2θ/ω, any one of the absolute-angle-designated range and the relative-angle-designated range may be acquired. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2004354229(A) 申请公布日期 2004.12.16
申请号 JP20030152772 申请日期 2003.05.29
申请人 RIGAKU CORP 发明人 YAMAGUCHI SUSUMU;OZAWA TETSUYA;INABA KATSUHIKO;MATSUO RYUJI
分类号 G01N23/20;(IPC1-7):G01N23/20 主分类号 G01N23/20
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