| 摘要 |
PROBLEM TO BE SOLVED: To obtain a waveform quality evaluation system capable of evaluating waveform quality on the basis of the characteristic of the form itself represented by a waveform. SOLUTION: This waveform quality evaluation system is provided with an oscilloscope 2 and a waveform quality evaluating device 3, and the waveform quality evaluating device 3 is provided with a storing means 32 and a CPU 36. The storing means 32 stores waveform evaluation value calculation reference and an adjustment parameter corresponding to an evaluation value of a waveform. The oscilloscope 2 inputs a waveform based on an adjustment parameter set by a DUT 1 and samples the waveform. Also, the CPU 36 calculates the characteristic amount of the sampled waveform, refers to the waveform evaluation value calculation reference to calculate an evaluation value based on the characteristic amount and outputs an adjustment parameter corresponding to the calculated evaluation value to the DUT 1. COPYRIGHT: (C)2005,JPO&NCIPI
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