发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To improve a dimensional accuracy of each of wiring lines when the wiring lines are formed adjacent to each other and having different widths. SOLUTION: A first plurality of wiring lines WL having a first width are periodically arranged to have a first interval therebetween. Second wiring lines SGL are arranged adjacent to one of the first wiring lines WL. A lower part of the second wiring lines SGL has a second width corresponding to n (n being an positive integer of 2 or higher) of the first width of the first wiring lines SL and (n-1) times the first interval. The upper part of the second wiring lines has n projections having the first width and (n-1) recesses. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004356491(A) 申请公布日期 2004.12.16
申请号 JP20030154247 申请日期 2003.05.30
申请人 TOSHIBA CORP 发明人 MIWA TADASHI
分类号 H01L21/28;H01L21/3213;H01L21/8247;H01L27/10;H01L27/115;H01L29/423;H01L29/49;H01L29/788;H01L29/792;(IPC1-7):H01L21/824;H01L21/321 主分类号 H01L21/28
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