发明名称 SIR MEASUREMENT DEVICE AND SIR MEASUREMENT METHOD
摘要 <p>A SIR calculation section (130) calculates a SIR value (D4) after rake synthesis from a desired wave power value of each finger obtained by an RSCP calculation section (110) and an interference wave power value of each finger obtained by an ISCP calculation section (120). A SIR correction section (140) corrects the SIR value (D4) by using the number of discrete signals used for RSCP calculation, the number of discrete signals used for ISCP calculation, and the number L of fingers used for rake synthesis. As a result, even when the number of discrete signals used for the RSCP calculation is different from the number of discrete signals used for the ISCP calculation, it is possible to eliminate a stationary difference from the logical value and realize a SIR measurement device (100) capable of performing a highly accurate measurement with high degree of freedom.</p>
申请公布号 WO2004109946(A1) 申请公布日期 2004.12.16
申请号 WO2004JP06158 申请日期 2004.04.28
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.;MURASE, TAICHI 发明人 MURASE, TAICHI
分类号 H04B1/707;H04B17/00;(IPC1-7):H04B1/707 主分类号 H04B1/707
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