发明名称 SCANNING EXPOSURE SYSTEM AND METHOD FOR EXPOSURE
摘要 PROBLEM TO BE SOLVED: To provide a scanning exposure system of the structure that a wafer can be accurately, easily aligned, and a gas is hardly introduced between a lens and the wafer. SOLUTION: A lower side surface of a convex lens 200 of a reduction projection optical system 3 becomes parallel to the wafer 4 and flat only at a central part (a width of about 10 mm) and its left and right become oblique surfaces when a cross section is taken in a predetermined direction. Meanwhile, when the cross section is taken in a direction crossing the predetermined direction, the lower side surface of the convex lens 200 becomes flat in the entirety. When a liquid immersion optical system is applied to the scanning exposure system of this convex lens, the structure that the wafer can be accurately aligned and the gas is hardly introduced between the lens and the wafer is obtained in the scanning exposure system. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004356205(A) 申请公布日期 2004.12.16
申请号 JP20030149375 申请日期 2003.05.27
申请人 OMI TADAHIRO 发明人 OMI TADAHIRO;SUGAWA SHIGETOSHI;TAKEHISA KIWAMU;YANAGIDA KIMIO
分类号 G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/20
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