| 摘要 |
PROBLEM TO BE SOLVED: To provide a test handler and its control method, of low cost and requiring less space, capable of efficiently manufacturing components by shortening the time required for testing. SOLUTION: First and second transfer tables 2 and 3 composed of a turn table are arranged near a transportation rail 1. The second transportation table 3 is arranged on the side opposite to, and in the back stream, of the first transportation table 2. The first transportation table 2 and the second transportation table 3 are provided with grips 2a and 3a. A part P is delivered between those and the transportation rail 1 at delivery positions 21 and 31, and the part P is positioned and attached to a contacting terminal connected to a test device at test positions 22 and 32. Related to the first transportation table 2 and the second transportation table 3, one is in test state of the part P while the other is in transportation state of the part P. COPYRIGHT: (C)2005,JPO&NCIPI
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