发明名称 PROCESS FOR FABRICATING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a process for fabricating a semiconductor device in which the capacitor area of a cross point type FeRAM can be increased while enhancing the product performance and work efficiency, and to provide a semiconductor device. SOLUTION: A lower electrode layer 2A other than a ferroelectric capacitor forming region X is formed thinner than the ferroelectric capacitor forming region X so that a ferroelectric layer 2B is formed only on the ferroelectric capacitor forming region X of the lower electrode layer 2A. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004356519(A) 申请公布日期 2004.12.16
申请号 JP20030154676 申请日期 2003.05.30
申请人 SEIKO EPSON CORP 发明人 FUKADA SHINICHI
分类号 H01L27/105;H01L21/8246;(IPC1-7):H01L27/105 主分类号 H01L27/105
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