SYSTEM AND METHOD FOR TESTING MANY DEVICES UNDER TEST IN PARALLEL

摘要

PROBLEM TO BE SOLVED: To provide a method for testing many devices under test ( DUTs )in parallel. SOLUTION: The method for testing many DUTs in parallel includes: preparing at least two DUTs which have input/output signal pins common to one input/output signal channel and to each of which a chip selection signal channel is connected, the chip selection signal channel providing a chip selection signal for specifying one output data among output data to be outputted through the common input/output channel; and thereafter, reading one of output data specified by the chip selection signal through the common input/output signal channel from one of the DUTs selected by the chip selection signal. COPYRIGHT: (C)2005,JPO&NCIPI