发明名称 Method of forming a pattern of sub-micron broad features
摘要 A pattern of very fine features (18) can be produced by illuminating an inorganic negative tone resist layer (16), provided on an electroplating base layer (14), by a beam (EB), which is able to cure the resist to a cured pattern according to the pattern to be formed, removing the non-illuminated portions of the resist layer and electroplating a layer (20) between the cured portions (18) of the resist layer.
申请公布号 US2004255305(A1) 申请公布日期 2004.12.16
申请号 US20040493176 申请日期 2004.04.20
申请人 VAN DOREN EGIDIUS GERARDUS PETRUS;VAN HEESCH HENDRIKUS CHRISTIANUS WILHEMUS 发明人 VAN DOREN EGIDIUS GERARDUS PETRUS;VAN HEESCH HENDRIKUS CHRISTIANUS WILHEMUS
分类号 G03F1/16;G03F7/00;G03F7/075;G03F7/11;G03F7/20;G03F7/40;G11B5/31;H01L21/027;H05K3/10;(IPC1-7):G06F9/00 主分类号 G03F1/16
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