发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a substrate and its forming method wherein, in a strain layer/stain-applied crystal layer structure, the crystallinity deterioration of the strain layer due to crystal defects caused in the strain-applied crystal layer structure is reduced, and the strain layer/strain-applied crystal layer structure is formed with a thin film on an insulation layer. SOLUTION: An insulation layer on a Si substrate and an SiGe layer on another Si substrate are bonded, using the semiconductor laminating technology, and the Si substrate at the SiGe layer side is removed by polishing, etc. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004356644(A) 申请公布日期 2004.12.16
申请号 JP20040215495 申请日期 2004.07.23
申请人 TOSHIBA CORP 发明人 USUDA KOJI;TAKAGI SHINICHI
分类号 H01L21/762;H01L21/02;H01L21/20;H01L21/336;H01L27/12;H01L29/786;(IPC1-7):H01L27/12 主分类号 H01L21/762
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