发明名称 METHOD FOR ANALYZING IMPURITIES IN METAL SODIUM
摘要 PROBLEM TO BE SOLVED: To simply and directly analyze impurities in metal sodium in a solid state in a short time without pretreating metal sodium. SOLUTION: An analyzing and measuring system is constituted by combining a glow discharge mass analyzer 10 with a circulating gas-refining type high-purity inert gas atmosphere glove box 14 provided with a gas-refining device 12, airtightly integrating the glove box and the sample chamber 16 of the glow discharge mass analyzer 10 by connecting the interlocking chamber 18 in the glove box to the sample chamber 16 and mounting an insertion probe 50 in the sample chamber through the interlocking chamber and used in this method for analyzing impurities in metal sodium. Metal sodium is cut in the glove box without being pretreated and molded to form a plate-shaped sample. The insertion probe is loaded with the solid sample to be mounted in the sample chamber and, after the sample chamber is once evacuated, the atmosphere in the sample chamber is replaced with a rare gas atmosphere and glow discharge is performed to carry out the mass analysis of secondary ions occurring from the sample. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004354132(A) 申请公布日期 2004.12.16
申请号 JP20030150303 申请日期 2003.05.28
申请人 JAPAN NUCLEAR CYCLE DEVELOPMENT INST STATES OF PROJECTS 发明人 IIJIMA MINORU
分类号 G01N27/62;G01N27/68;(IPC1-7):G01N27/62 主分类号 G01N27/62
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