发明名称
摘要 A process for producing a semiconductor device comprising the steps of: forming a metal wiring layer containing copper as the main component on a semiconductor substrate; forming an insulating film on the entire surface of the resulting semiconductor substrate; removing the insulating film only from a place where a wire of gold or aluminum is to be bonded, in order to expose a part of the metal wiring layer; forming a layer of copper silicide or a layer of a compound of copper and boron in a surface layer of the exposed part of the metal wiring layer; and bonding a wire to a surface of the layer of copper silicide or the layer of the compound of copper and boron.
申请公布号 JP3602024(B2) 申请公布日期 2004.12.15
申请号 JP20000012979 申请日期 2000.01.21
申请人 发明人
分类号 H01L23/52;H01L21/3205;H01L21/60;H01L21/768;H01L23/485;H01L23/532 主分类号 H01L23/52
代理机构 代理人
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