发明名称 Semiconductor device comprising a MIS transistor and method for manufacturing the same
摘要 <p>A semiconductor device such as a lateral power MOS transistor includes: a semiconductor substrate (3) with a principal plane (3a); a base region (20,21) disposed on the principal plane (3a); a source region (22) disposed on the principal plane (3a) in the base region (20,21) to be shallower than the base region (20,21); a drain region (25) disposed on the principal plane (3a), and spaced to the base region (20,21); a trench (26) disposed on the principal plane (3a); a trench gate electrode (28) disposed in the trench (26) through a trench gate insulation film (27); a planar gate electrode (31) disposed on the principal plane (3a) of the semiconductor substrate (3) through a planar gate insulation film (30); and an impurity diffusion region (35) having high concentration of impurities and disposed in a portion of the base region (20,21) to be a channel region facing the planar gate electrode (31).</p>
申请公布号 EP1487023(A2) 申请公布日期 2004.12.15
申请号 EP20040013680 申请日期 2004.06.09
申请人 DENSO CORPORATION 发明人 SHIRAKI, SATOSHI;NAKAYAMA, YOSHIAKI;MIZUNO, SHOJI;NAKANO, TAKASHI;YAMADA, AKIRA
分类号 H01L21/76;H01L29/78;H01L21/265;H01L21/336;H01L21/763;H01L21/8234;H01L27/08;H01L29/10;H01L29/423;H01L29/786;(IPC1-7):H01L29/78 主分类号 H01L21/76
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