发明名称 |
Semiconductor device comprising a MIS transistor and method for manufacturing the same |
摘要 |
<p>A semiconductor device such as a lateral power MOS transistor includes: a semiconductor substrate (3) with a principal plane (3a); a base region (20,21) disposed on the principal plane (3a); a source region (22) disposed on the principal plane (3a) in the base region (20,21) to be shallower than the base region (20,21); a drain region (25) disposed on the principal plane (3a), and spaced to the base region (20,21); a trench (26) disposed on the principal plane (3a); a trench gate electrode (28) disposed in the trench (26) through a trench gate insulation film (27); a planar gate electrode (31) disposed on the principal plane (3a) of the semiconductor substrate (3) through a planar gate insulation film (30); and an impurity diffusion region (35) having high concentration of impurities and disposed in a portion of the base region (20,21) to be a channel region facing the planar gate electrode (31).</p> |
申请公布号 |
EP1487023(A2) |
申请公布日期 |
2004.12.15 |
申请号 |
EP20040013680 |
申请日期 |
2004.06.09 |
申请人 |
DENSO CORPORATION |
发明人 |
SHIRAKI, SATOSHI;NAKAYAMA, YOSHIAKI;MIZUNO, SHOJI;NAKANO, TAKASHI;YAMADA, AKIRA |
分类号 |
H01L21/76;H01L29/78;H01L21/265;H01L21/336;H01L21/763;H01L21/8234;H01L27/08;H01L29/10;H01L29/423;H01L29/786;(IPC1-7):H01L29/78 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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