METHOD AND CIRCUIT FOR CONTROLLING BIAS CURRENT OF SEMICONDUCTOR DEVICE, ESPECIALLY INCLUDING A SERIAL RESISTER STORING FUSE CUTTING INFORMATION

摘要

PURPOSE: A method and a circuit for controlling the bias current of a semiconductor device are provided to exactly control the bias current by obtaining the fuse cutting information rapidly and exactly with use of the serial resister. CONSTITUTION: A method for controlling the bias current of a semiconductor device includes the steps of: measuring(S21) the bias current generated at a predetermined bias circuit at the wafer state and determining whether the measured bias current falls within a specific range or not; finely adjusting(S23) the bias current by selectively cutting the plurality of the fuses; reading(S24) the information for the fuse cutting by the external command applied from the outside of chip; storing(S25) the information for the fuse cutting on the serial register; and determining(S26) the accuracy for the fuse cutting by reading the information of the fuse cutting stored at the serial register.