发明名称 POLISHING SYSTEM AND POLISHING METHOD
摘要 A polishing apparatus and a polishing method by which it is possible to restrain variations in the composition of an electrolytic solution 2 between a wafer 3 and a counter electrode 5 , and the like, and to make current density distribution substantially constant in the plane of the wafer. The polishing apparatus, for planarizing a surface to be polished 3 a by electrolytic combined polishing composed of a combination of electropolishing and mechanical polishing, includes a voltage impressing means 5 disposed oppositely to the surface to be polished 3 a, and a discharging means for discharging foreign matter intermediately present between the voltage impressing means 5 and the object of polishing.
申请公布号 KR20040104592(A) 申请公布日期 2004.12.10
申请号 KR20047016977 申请日期 2003.04.14
申请人 发明人
分类号 B23H5/06;B23H5/08;B23H5/00;B24B53/00;B24B53/007;C25F3/16;H01L21/321 主分类号 B23H5/06
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