发明名称 Method of forming precision recessed gate structure
摘要 A method for precise thinning to form a recess to a precise depth in a crystalline silicon layer, which can be used to form various devices, such as MOSFET devices, includes the following steps. Form a patterning mask with a window therethrough over the top surface of the silicon layer. Form an amorphized region in the top surface of the silicon layer below the window. Selectively etch away the amorphized region of the silicon layer to form a recess in the surface of the silicon layer, and remove the patterning mask In the case of an MOSFET device form a hard mask below the patterning mask with the window extending therethrough. Then create sidewall spacers in the window through the hard mask and form a gate electrode stack in the window. Then remove the hard mask and form the source/drain extensions, halos and regions plus silicide and complete the MOSFET device.
申请公布号 US2004248348(A1) 申请公布日期 2004.12.09
申请号 US20030453080 申请日期 2003.06.03
申请人 RAUSCH WERNER A.;WAGNER TINA J.;DESHPANDE SADANAND V. 发明人 RAUSCH WERNER A.;WAGNER TINA J.;DESHPANDE SADANAND V.
分类号 H01L21/265;H01L21/28;H01L21/3065;H01L21/3213;H01L21/336;H01L29/78;(IPC1-7):H01L21/336;H01L21/461 主分类号 H01L21/265
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