发明名称 Integrated semiconductor memory has memory cell with inversion channel and small gate dielectric thickness permitting thermal majority carriers to tunnel to gate electrode
摘要 <p>An integrated semiconductor memory cell (1) comprises at least one transistor (3) with an inversion channel when on and two source/drain regions (5,6) with semiconductor (4) between them and a gate (7,8) above a dielectric (9). A thin dielectric region provides a high resistance tunnel to the gate for thermally produced majority carriers when off.</p>
申请公布号 DE10320874(A1) 申请公布日期 2004.12.09
申请号 DE2003120874 申请日期 2003.05.09
申请人 INFINEON TECHNOLOGIES AG 发明人 SPITZER, ANDREAS
分类号 H01L21/334;H01L21/8242;H01L21/8244;H01L21/84;H01L27/108;H01L27/11;H01L27/12;H01L29/08;H01L29/423;(IPC1-7):H01L29/78;H01L27/105 主分类号 H01L21/334
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