发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor substrate with an SiGe layer that makes the SiGe layer thin in the thickness, alleviates distortion, and reduces the threading dislocation density. SOLUTION: In the manufacturing method of the semiconductor substrate, a silicon substrate is immersed in pure water, an ultrasonic wave is applied to the substrate, thereafter OSF cores are formed on the surface of the silicon substrate by applying heat treatment to the substrate, and the SiGe layer or the SiGe layer, and a Si layer are formed on the silicon substrate. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004349521(A) 申请公布日期 2004.12.09
申请号 JP20030145764 申请日期 2003.05.23
申请人 TOSHIBA CERAMICS CO LTD 发明人 KURITA HISATSUGU;SENSAI KOJI;IGARASHI MASATO;SENDA TAKESHI
分类号 H01L21/205;H01L21/20;(IPC1-7):H01L21/20 主分类号 H01L21/205
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