发明名称 Methods of forming a conductive structure in an integrated circuit device
摘要 A conductive structure is formed in an integrated circuit device by forming a lower conductive pattern on a substrate. A barrier metal layer is formed on the lower conductive pattern. The barrier metal layer is flushed with a gas that includes a halogen group gas and an upper conductive layer is formed on the barrier metal layer.
申请公布号 US2004248397(A1) 申请公布日期 2004.12.09
申请号 US20040796437 申请日期 2004.03.09
申请人 SEO JUNG-HUN;CHOI GIL-HEYUN;LEE JONG-MYEONG;PARK HEE-SOOK 发明人 SEO JUNG-HUN;CHOI GIL-HEYUN;LEE JONG-MYEONG;PARK HEE-SOOK
分类号 H01L21/28;H01L21/285;H01L21/321;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L29/74 主分类号 H01L21/28
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