发明名称 Apparatus and method for monitoring and predicting failures in system interconnect
摘要 An apparatus and a method for detecting high impedance failures in system interconnects. The apparatus and method may measure resistance of a connection of one or more representative sets of pins on a partitioned chip to a circuit board and determine if the measured resistance of each of the one or more representative sets of pins is less than a threshold value. The measuring step is executed while the circuit board is operating.
申请公布号 US2004245996(A1) 申请公布日期 2004.12.09
申请号 US20030453595 申请日期 2003.06.04
申请人 BARR ANDREW H.;POMARANSKI KEN G.;SHIDLA DALE J. 发明人 BARR ANDREW H.;POMARANSKI KEN G.;SHIDLA DALE J.
分类号 G01R27/20;G01R31/04;G01R31/317;H05K1/02;(IPC1-7):G01R31/08 主分类号 G01R27/20
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