发明名称 |
Apparatus and method for monitoring and predicting failures in system interconnect |
摘要 |
An apparatus and a method for detecting high impedance failures in system interconnects. The apparatus and method may measure resistance of a connection of one or more representative sets of pins on a partitioned chip to a circuit board and determine if the measured resistance of each of the one or more representative sets of pins is less than a threshold value. The measuring step is executed while the circuit board is operating.
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申请公布号 |
US2004245996(A1) |
申请公布日期 |
2004.12.09 |
申请号 |
US20030453595 |
申请日期 |
2003.06.04 |
申请人 |
BARR ANDREW H.;POMARANSKI KEN G.;SHIDLA DALE J. |
发明人 |
BARR ANDREW H.;POMARANSKI KEN G.;SHIDLA DALE J. |
分类号 |
G01R27/20;G01R31/04;G01R31/317;H05K1/02;(IPC1-7):G01R31/08 |
主分类号 |
G01R27/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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