发明名称 HDP-CVD MULTISTEP GAPFILL PROCESS
摘要 Abstract of the Disclosure A gapfill process is provided using cycling of HDP-CVD deposition, etching, and deposition step. The fluent gas during the first deposition step includes an inert gas such as He, but includes H2 during the remainder deposition step. The higher average molecular weight of the fluent gas during the first deposition step provides some cusping over structures that define the gap to protect them during the etching step. The lower average molecular weight of the fluent gas during the remainder deposition step has reduced sputtering characteristics and is effective at filling the remainder of the gap.
申请公布号 US2004245091(A1) 申请公布日期 2004.12.09
申请号 US20030456611 申请日期 2003.06.04
申请人 APPLIED MATERIALS, INC. 发明人 KARIM M ZIAUL;KAPOOR BIKRAM;WANG ANCHUAN;LI DONGQING;OZEKI KATSUNARY;VELLAIKAL MANOJ;LI ZHUANG
分类号 C23C14/00;C23C14/32;C23C16/00;C23C16/04;C23C16/40;C23C16/56;C25B9/00;C25B11/00;H01L;H01L21/30;H01L21/311;H01L21/316;H01L21/768;(IPC1-7):C23C14/00 主分类号 C23C14/00
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