发明名称 SUBSTRATE CLEANING APPARATUS AND METHOD
摘要 <p>A substrate cleaning apparatus is used for cleaning and drying a substrate such as a semiconductor wafer used in a semiconductor fabricating process or the like. The substrate cleaning apparatus includes a substrate holding mechanism (10) configured to hold the substrate (W), and a rotating mechanism (20) configured to rotate the substrate holding mechanism (10). At least one of components of the substrate cleaning apparatus has a surface structure to which droplets are hardly attached.</p>
申请公布号 WO2004107427(A1) 申请公布日期 2004.12.09
申请号 WO2004JP07560 申请日期 2004.05.26
申请人 EBARA CORPORATION;NISHIOKA, YUKIKO;ATO, KOJI;YONEKURA, RYOSUKE;ARIGA, YOSHIKAZU 发明人 NISHIOKA, YUKIKO;ATO, KOJI;YONEKURA, RYOSUKE;ARIGA, YOSHIKAZU
分类号 H01L21/304;B08B7/00;H01L21/00;(IPC1-7):H01L21/304 主分类号 H01L21/304
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