Method and device for measuring at least a geometric quantity of an optically reflecting surface

摘要

This invention concerns a process and a device for measuring at least one geometric magnitude of an optically reflective surface. The process is rapid, reliable, and precise, and makes it possible to quantify the curvatures and/or slopes and reliefs of the optically reflective surface without the risks of damaging the surface to be measured, and which is suitable for measuring large surfaces. The process for geometric measurement of an optically reflective surface to be measured S consists of using a camera (2) to observe the image of this surface to be measured S placed in a measuring space (1), then interpreting the image of this surface to be measured S viewed by the camera (2) as a function of images obtained previously by calibration of a reference surface to transform this image into quantitative values characterizing at least one geometric magnitude of the optically reflective surface to be measured S.