发明名称 Semiconductor production process for high aspect ratio memory circuits forms surfaces perpendicular and not perpendicular to substrate and ion implants to give selective wet etch
摘要 <p>A semiconductor production process comprises forming surfaces both perpendicular (B1) and not perpendicular (B2) to the substrate surface (1) and vertically ion-implanting (I) the latter to give it an increased wet etch rate. Selective wet etching of the non-perpendicular surfaces (B2) is then performed.</p>
申请公布号 DE10321494(A1) 申请公布日期 2004.12.09
申请号 DE2003121494 申请日期 2003.05.13
申请人 INFINEON TECHNOLOGIES AG 发明人 STEGEMANN, MAIK;WEGE, STEPHAN
分类号 H01L21/28;H01L21/311;H01L21/3115;H01L21/334;H01L21/768;H01L21/8242;H01L29/94;(IPC1-7):H01L21/824;H01L21/306 主分类号 H01L21/28
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