发明名称 |
Semiconductor production process for high aspect ratio memory circuits forms surfaces perpendicular and not perpendicular to substrate and ion implants to give selective wet etch |
摘要 |
<p>A semiconductor production process comprises forming surfaces both perpendicular (B1) and not perpendicular (B2) to the substrate surface (1) and vertically ion-implanting (I) the latter to give it an increased wet etch rate. Selective wet etching of the non-perpendicular surfaces (B2) is then performed.</p> |
申请公布号 |
DE10321494(A1) |
申请公布日期 |
2004.12.09 |
申请号 |
DE2003121494 |
申请日期 |
2003.05.13 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
STEGEMANN, MAIK;WEGE, STEPHAN |
分类号 |
H01L21/28;H01L21/311;H01L21/3115;H01L21/334;H01L21/768;H01L21/8242;H01L29/94;(IPC1-7):H01L21/824;H01L21/306 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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