发明名称 Method and apparatus for measuring the geometry of a material strip
摘要 Attenuation of light (10'-10''') from the first lamp (6) passing through the band (2) gives a measure of the thickness of the band. The center of the first diverging light beam falls on a measurement spot (12) on the center of the band. Photocells (8',8''') are mounted under the band. The measurement system (1) has a C-shaped housing (3) and the lamps are mounted in the top part (4) and the photocells are mounted in the bottom part (5). Light from the second lamp (13) is reflected off the surface of the band into a camera.
申请公布号 EP1460375(A3) 申请公布日期 2004.12.08
申请号 EP20040006805 申请日期 2004.03.22
申请人 IMS MESSSYSTEME GMBH 发明人 FACKERT, RAINER
分类号 G01B11/02;G01B11/06 主分类号 G01B11/02
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