发明名称 SYSTEM FOR RAPID X-RAY INSPECTION OF ENCLOSURES
摘要 <p>An inspection system (20) for automatically detecting the presence of a concealed item within an enclosure (6). A beam of penetrating radiation (2) is incident on the enclosure (6) and detected by a detector (8) disposed on the side of the enclosure (6) opposite to the incident beam (2). By scanning the relative orientation of the enclosure (6) with respect to the beam (2), the penetrating radiation (2) transmitted through the enclosure (6) is mapped, compared with known properties of the enclosure (6), and the presence of material concealed within the enclosure (6) is determined.</p>
申请公布号 WO1998003889(A1) 申请公布日期 1998.01.29
申请号 US1997012775 申请日期 1997.07.22
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