发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE IN FORMING PLURAL INTERCONNECTIONS IN ONE IDENTICAL INTERCONNECTION LAYER OVER SEMICONDUCTOR SUBSTRATE |
摘要 |
<p>PURPOSE: A method of manufacturing a semiconductor integrated circuit device in forming plural interconnections in one identical interconnection layer over a semiconductor substrate is provided to promote an increase of an integration degree by using a technique for reducing a memory size of an SRAM. CONSTITUTION: A method of manufacturing a semiconductor integrated circuit device in forming plural interconnections in one identical interconnection layer over a semiconductor substrate includes a dividing process and a forming process. The dividing process is performed to divide the interconnections into plural groups and prepare plural sheets of photo-masks. Each of the photo-masks is formed with a pattern for interconnections contained in each of the plural groups. The forming process is performed to form the interconnections by plural photo-lithography processes using the plural sheets of photo-masks.</p> |
申请公布号 |
KR20040103312(A) |
申请公布日期 |
2004.12.08 |
申请号 |
KR20040037143 |
申请日期 |
2004.05.25 |
申请人 |
RENESAS TECHNOLOGY CORP. |
发明人 |
CHAKIHARA, HIRAKU;NISHIDA, AKIO;NOGUCHI, MITSUHIRO;TADOKORO, MASAHIRO;WADA, NAONORI |
分类号 |
H01L21/28;H01L21/027;H01L21/302;H01L21/3205;H01L21/8234;H01L21/8238;H01L21/8244;H01L27/088;H01L27/092;H01L27/10;H01L27/11;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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