发明名称 Novel transistor with ultra shallow tip and method of fabrication
摘要 A novel transistor (200) with a low resistance ultra shallow tip region (214) and its method of fabrication. The novel transistor of the present invention has a source/drain extension of tip region (210) comprising an ultra shallow region (214) which extends beneath the gate electrode and a raised region (216). <IMAGE>
申请公布号 EP1253632(A3) 申请公布日期 2004.12.08
申请号 EP20020015293 申请日期 1995.12.21
申请人 INTEL CORPORATION 发明人 CHAU, ROBERT S.;PACKAN, PAUL A.;CHERN, CHAN-HONG;YAU, LEOPOLDO D.;JAN, CHIA-HONG;WELDON, KEVIN R.
分类号 H01L21/225;H01L21/28;H01L21/336;H01L21/8238;H01L29/08;H01L29/417;H01L29/45;H01L29/49;H01L29/78 主分类号 H01L21/225
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