发明名称 |
Optimization of OPC design factors utilizing an advanced algorithm on a low voltage CD-SEM system |
摘要 |
A system for evaluating optical proximity corrected (OPC) designs is provided. The system includes an analysis system for performing measurements relating to a segment of a feature. The analysis system is configured to determine a first image for the segment of the feature based upon the measurements. The analysis system determines a second image to facilitate analysis of the first image and evaluates OPC designs based upon comparisons of the first and second image.
|
申请公布号 |
US6829380(B1) |
申请公布日期 |
2004.12.07 |
申请号 |
US20000642959 |
申请日期 |
2000.08.21 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
CHOO BRYAN K.;SINGH BHANWAR;YEDUR SANJAY K. |
分类号 |
G03F7/20;(IPC1-7):G06K9/00;G01N21/00 |
主分类号 |
G03F7/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|