发明名称 METHOD FOR MANUFACTURING CMOS TRANSISTOR TO SIMPLIFY PROCESS USING SOURCE/DRAIN EXTENSION REGION
摘要 PURPOSE: A method for manufacturing a CMOS transistor is provided to simplify photo process by using an SDE(Source/Drain Extension) region. CONSTITUTION: A first and second gate(311,313) are formed on a semiconductor substrate(100) defined by a first and second active region(110,130). A first and second sacrificial spacer are formed at both sidewalls of the first and second gate. An N-type source/drain region(110b) is formed in the first active region by implanting dopants using a first photoresist pattern, the first gate and the first sacrificial spacer as a mask. The first sacrificial spacer is removed, and an N-type source/drain extension region(110a) is formed in the first active region by implanting dopants using the first photoresist pattern and the first gate as a mask. After the first photoresist pattern is removed, a P-type source/drain region(130b) is formed in the second active region by implanting dopants using a second photoresist pattern, the second gate and the second sacrificial spacer as a mask. The second sacrificial spacer is removed, and a P-type source/drain extension region(130a) is formed in the second active region by implanting dopants using the second photoresist pattern and the second gate as a mask.
申请公布号 KR20040102656(A) 申请公布日期 2004.12.08
申请号 KR20030034184 申请日期 2003.05.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOO, GANG SU;LEE, JU WON;PARK, JAE EON;YANG, JONG HO
分类号 H01L21/8238;(IPC1-7):H01L21/823 主分类号 H01L21/8238
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