发明名称 SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF TO IMPROVE CAPACITY OF MEMORY CELL PER UNIT AREA
摘要 <p>PURPOSE: A semiconductor memory device and a manufacturing method thereof are provided to improve the capacity of a memory cell per a unit area at low cost by using a protruded semiconductor layer. CONSTITUTION: A semiconductor memory device includes a first conductive type semiconductor substrate(100), a plurality of protruded semiconductor layers(110) and a plurality of memory cells. The memory cell is formed on a surface of each protruded semiconductor layer. The memory cell is composed of a charge storing layer of an ONO layer structure(510,530,520), a control gate(500), and a second conductive type impurity-diffused layer(720).</p>
申请公布号 KR20040102349(A) 申请公布日期 2004.12.04
申请号 KR20040037944 申请日期 2004.05.27
申请人 FUJIO MASUOKA;SHARP CORPORATION 发明人 ENDOH, TETSUO;HORII, SHINJI;MASUOKA, FUJIO;TAKEUCHI, NOBORU;TANIGAMI, TAKUJI;WADA, YOSHIHISA;YOKOYAMA, TAKASHI
分类号 G11C16/04;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 G11C16/04
代理机构 代理人
主权项
地址
您可能感兴趣的专利