发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF TO IMPROVE CAPACITY OF MEMORY CELL PER UNIT AREA |
摘要 |
<p>PURPOSE: A semiconductor memory device and a manufacturing method thereof are provided to improve the capacity of a memory cell per a unit area at low cost by using a protruded semiconductor layer. CONSTITUTION: A semiconductor memory device includes a first conductive type semiconductor substrate(100), a plurality of protruded semiconductor layers(110) and a plurality of memory cells. The memory cell is formed on a surface of each protruded semiconductor layer. The memory cell is composed of a charge storing layer of an ONO layer structure(510,530,520), a control gate(500), and a second conductive type impurity-diffused layer(720).</p> |
申请公布号 |
KR20040102349(A) |
申请公布日期 |
2004.12.04 |
申请号 |
KR20040037944 |
申请日期 |
2004.05.27 |
申请人 |
FUJIO MASUOKA;SHARP CORPORATION |
发明人 |
ENDOH, TETSUO;HORII, SHINJI;MASUOKA, FUJIO;TAKEUCHI, NOBORU;TANIGAMI, TAKUJI;WADA, YOSHIHISA;YOKOYAMA, TAKASHI |
分类号 |
G11C16/04;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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