发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING SHALLOW TRENCH ISOLATION TO REDUCE EFFECTIVELY INNER STRESS OF SILICON SUBSTRATE
摘要 PURPOSE: A method of manufacturing a semiconductor device using STI(Shallow Trench Isolation) is provided to reduce effectively inner stress of a silicon substrate by using a non-uniform liner. CONSTITUTION: A trench(2) is formed in a semiconductor substrate(1). An insulating layer(4) for lessening inner stress of the substrate is formed at a bottom and sides of the trench. The insulating layer includes a first portion corresponding to the bottom of the trench and a second portion corresponding to the sides of the trench. The thickness of the first portion is different from that of the second portion.
申请公布号 KR20040101969(A) 申请公布日期 2004.12.03
申请号 KR20040091361 申请日期 2004.11.10
申请人 ELPIDA MEMORY, INC. 发明人 TAMURA, KAZUHIRO
分类号 H01L21/76;H01L21/762;(IPC1-7):H01L21/762 主分类号 H01L21/76
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