发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING SHALLOW TRENCH ISOLATION TO REDUCE EFFECTIVELY INNER STRESS OF SILICON SUBSTRATE |
摘要 |
PURPOSE: A method of manufacturing a semiconductor device using STI(Shallow Trench Isolation) is provided to reduce effectively inner stress of a silicon substrate by using a non-uniform liner. CONSTITUTION: A trench(2) is formed in a semiconductor substrate(1). An insulating layer(4) for lessening inner stress of the substrate is formed at a bottom and sides of the trench. The insulating layer includes a first portion corresponding to the bottom of the trench and a second portion corresponding to the sides of the trench. The thickness of the first portion is different from that of the second portion.
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申请公布号 |
KR20040101969(A) |
申请公布日期 |
2004.12.03 |
申请号 |
KR20040091361 |
申请日期 |
2004.11.10 |
申请人 |
ELPIDA MEMORY, INC. |
发明人 |
TAMURA, KAZUHIRO |
分类号 |
H01L21/76;H01L21/762;(IPC1-7):H01L21/762 |
主分类号 |
H01L21/76 |
代理机构 |
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地址 |
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