发明名称 |
METHOD AND DEVICE FOR CORRECTING REPEATED RUNOUT (RRO) OF DATA STORAGE DEVICE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To improve a method and a device for correcting the RRO of a data storage device. <P>SOLUTION: The method for reducing the RRO errors includes the step of obtaining an RRO measured value for each track, the step of calculating the discrete Fourier conversion (EFT) for each RRO measured value to characterize the RRO measured value for each track by using real and false numerical values, and the step of executing minimum square conformance for all the real numerical values to specify the first group (n+1) coefficient of an n-order polynomial function which is the function of a track (r) and represented by A<SB>i</SB>(r)=a<SB>n</SB>r<SP>n</SP>+a(<SB>n-1</SB>)r(<SP>n-1</SP>)+... +a<SB>1</SB>r+a<SB>0</SB>. Further, the method includes the step of executing minimum square conformance for all the false numerical values to specify the second group (n+1) coefficient of an n-order polynomial function which is the function of a track (r) and represented by B<SB>i</SB>(r)=b<SB>n</SB>r<SP>n</SP>+b(<SB>n-1</SB>)r(<SP>n-1</SP>)+... +b<SB>1</SB>r+b<SB>0</SB>. RRO correction is executed based on DRRO(r, s)=Σ<SB>iforall</SB>HäA<SB>i</SB>(r)cos(i(s2π/total_sectors))+B<SB>i</SB>(r)sin(i(s2π/total_sectors))}. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
申请公布号 |
JP2004342298(A) |
申请公布日期 |
2004.12.02 |
申请号 |
JP20040139372 |
申请日期 |
2004.05.10 |
申请人 |
HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS BV |
发明人 |
CHANG JEN-YUAN;RALEY JAY FRANCIS |
分类号 |
G11B21/10;G11B5/596;G11B20/10;(IPC1-7):G11B21/10 |
主分类号 |
G11B21/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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