发明名称 |
METHOD FOR MANUFACTURING STRAINED CRYSTALLINE LAYER ON INSULATOR, SEMICONDUCTOR STRUCTURE BY SAME METHOD, AND MANUFACTURED SEMICONDUCTOR STRUCTURE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a simple method for manufacturing a semiconductor structure which has crystal of high quality and also has a highly strained crystalline semiconductor layer on an insulator. <P>SOLUTION: The method is provided with: a semiconductor donor substrate comprising germanium and/or an A(III)-B(V)-semiconductor; at least one first crystalline epitaxial layer, in a first step, wherein the content of germanium and/or the A(III)-B(V)-semiconductor of a buffer layer of the first layer is decreased during the first step; at least one insulator layer, in a second step; wherein the first layer is provided between the substrate and the insulator layer; the first layer, which is split in a third step; and at least one second crystalline epitaxial layer on the split first layer, in a fourth step. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
申请公布号 |
JP2004343052(A) |
申请公布日期 |
2004.12.02 |
申请号 |
JP20040018825 |
申请日期 |
2004.01.27 |
申请人 |
SOI TEC SILICON ON INSULATOR TECHNOLOGIES |
发明人 |
AULNETTE CECILE;MAZURE CARLOS |
分类号 |
H01L21/20;H01L21/00;H01L21/02;H01L21/762;H01L21/84;H01L27/12;(IPC1-7):H01L27/12 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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