发明名称 METHOD FOR MANUFACTURING STRAINED CRYSTALLINE LAYER ON INSULATOR, SEMICONDUCTOR STRUCTURE BY SAME METHOD, AND MANUFACTURED SEMICONDUCTOR STRUCTURE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a simple method for manufacturing a semiconductor structure which has crystal of high quality and also has a highly strained crystalline semiconductor layer on an insulator. <P>SOLUTION: The method is provided with: a semiconductor donor substrate comprising germanium and/or an A(III)-B(V)-semiconductor; at least one first crystalline epitaxial layer, in a first step, wherein the content of germanium and/or the A(III)-B(V)-semiconductor of a buffer layer of the first layer is decreased during the first step; at least one insulator layer, in a second step; wherein the first layer is provided between the substrate and the insulator layer; the first layer, which is split in a third step; and at least one second crystalline epitaxial layer on the split first layer, in a fourth step. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2004343052(A) 申请公布日期 2004.12.02
申请号 JP20040018825 申请日期 2004.01.27
申请人 SOI TEC SILICON ON INSULATOR TECHNOLOGIES 发明人 AULNETTE CECILE;MAZURE CARLOS
分类号 H01L21/20;H01L21/00;H01L21/02;H01L21/762;H01L21/84;H01L27/12;(IPC1-7):H01L27/12 主分类号 H01L21/20
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