发明名称 SEMICONDUCTOR MEMORY, SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD, PORTABLE ELECTRONIC APPARATUS, AND IC CARD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor memory in which the problem of overerasure and resulting failure of reading can be eliminated. SOLUTION: The semiconductor memory comprises a field effect transistor 30A having a gate electrode 3, and a pair of source/drain diffusion regions 13 and 13 on a semiconductor substrate 1. Memory function bodies 11 and 11 are provided on the side of the gate electrode 3. The memory function body 11 comprises a charge storage film 23 of semiconductor or conductor having a function for storing charges and formed to have an L-shaped cross-section, a plurality of fine particles 10 having a function for storing charges, and insulators 9 and 16 having a function for preventing scattering of stored charges. Quantity of a current flowing from one source/drain diffusion region to the other source/drain diffusion region upon application of a voltage to the gate electrode 3 can be varied depending on the quantity of charges held in the charge holding section consisting of the charge storage film 23 and the fine particles 10. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004342730(A) 申请公布日期 2004.12.02
申请号 JP20030135608 申请日期 2003.05.14
申请人 SHARP CORP 发明人 OGURA TAKAYUKI;IWATA HIROSHI;SHIBATA AKIHIDE
分类号 H01L21/8234;H01L21/8247;H01L27/088;H01L27/10;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824;H01L21/823 主分类号 H01L21/8234
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