发明名称 |
X-ray fluorescence measuring system and metods for trace elements |
摘要 |
An X-ray fluorescence measuring system and related measuring methods are disclosed, the system using X-ray energy at a level of less than 80 KeV may be directed toward a material, such as coal. The energy fluoresced may be detected (10) and used to measure the elemental composition of the material, including trace elements. The material may be moving or stationary.
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申请公布号 |
US2004240606(A1) |
申请公布日期 |
2004.12.02 |
申请号 |
US20040488723 |
申请日期 |
2004.03.03 |
申请人 |
LAURILA MELVIN J.;BUCHMANN CLAUS C. |
发明人 |
LAURILA MELVIN J.;BUCHMANN CLAUS C. |
分类号 |
G01N23/223;(IPC1-7):G01T1/36 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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