发明名称 |
SEMICONDUCTOR MEMORY DEVICE FOR REDUCING CURRENT CONSUMPTION AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor memory device and a manufacturing method thereof are provided to reduce current consumption by forming a heat-radiating material layer with a plasma-oxidized surface under a chalcogenide material layer. CONSTITUTION: A heat-radiating part is formed between a transistor(20) and a data storage part(30). A metal line(50) is connected with the data storage part. The data storage part includes a chalcogenide material layer(40) for storing data according to a phase shift caused by the heat of the heat-radiating part. The heat-radiating part includes a via hole for exposing partially the transistor, a spacer(34) formed at sides of the via hole, and a heat-radiating material layer(36) filled in the via hole. An upper surface of the heat-radiating part is oxidized.
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申请公布号 |
KR20040100499(A) |
申请公布日期 |
2004.12.02 |
申请号 |
KR20030032882 |
申请日期 |
2003.05.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JEONG HYEON;LEE, WON TAE;PARK, YEONG SU |
分类号 |
H01L27/105;H01L27/10;H01L27/24;H01L45/00;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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