发明名称 SEMICONDUCTOR MEMORY DEVICE FOR REDUCING CURRENT CONSUMPTION AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor memory device and a manufacturing method thereof are provided to reduce current consumption by forming a heat-radiating material layer with a plasma-oxidized surface under a chalcogenide material layer. CONSTITUTION: A heat-radiating part is formed between a transistor(20) and a data storage part(30). A metal line(50) is connected with the data storage part. The data storage part includes a chalcogenide material layer(40) for storing data according to a phase shift caused by the heat of the heat-radiating part. The heat-radiating part includes a via hole for exposing partially the transistor, a spacer(34) formed at sides of the via hole, and a heat-radiating material layer(36) filled in the via hole. An upper surface of the heat-radiating part is oxidized.
申请公布号 KR20040100499(A) 申请公布日期 2004.12.02
申请号 KR20030032882 申请日期 2003.05.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JEONG HYEON;LEE, WON TAE;PARK, YEONG SU
分类号 H01L27/105;H01L27/10;H01L27/24;H01L45/00;(IPC1-7):H01L27/10 主分类号 H01L27/105
代理机构 代理人
主权项
地址