INTEGRATED CIRCUIT TESTING SYSTEM

摘要

PROBLEM TO BE SOLVED: To provide an integrated circuit testing system capable of extracting a failure candidate node at immediately after testing. SOLUTION: The integrated circuit testing system includes a failure simulator 1 and an integrated circuit testing device 5. Therein, the failure simulator 1 comprises a failure simulating part performing a failure simulation by using first STIL test data 3 written by STIL language and an STIL test data generating part generating second STIL test data 6 with failure candidate node information written with the first STIL test data 3, which specifies a failure candidate node for each failure candidate address based on failure dictionary information obtained from the failure simulation; the integrated circuit testing device 5 comprises a testing part performing a test for an integrated circuit to be tested by using the second STIL test data 6. COPYRIGHT: (C)2005,JPO&NCIPI