发明名称 CLEANING METHOD OF HEAT PROCESSING EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide a cleaning method of heat processing equipment in which cleaning operation can be carried out quickly by removing an unnecessary film, i.e. a silicon oxide film formed by TEOS (tetraethyl orthosilicate), adhering to the structure in the heat processing equipment efficiently and quickly at a high etching rate. SOLUTION: The cleaning method of heat processing equipment for depositing an SiO<SB>2</SB>film using TEOS for a workpiece in a processing vessel which can be evacuated is provided with a cleaning step where HF gas and NH<SB>3</SB>gas are fed into the processing vessel. Cleaning operation is carried out quickly by removing an unnecessary adhesion film, i.e. a silicon oxide film formed by TEOS, by using a mixture gas of HF gas and NH<SB>3</SB>gas as cleaning gas like this while suppressing damage on the structure in the heat processing equipment. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004343095(A) 申请公布日期 2004.12.02
申请号 JP20040124096 申请日期 2004.04.20
申请人 TOKYO ELECTRON LTD 发明人 HASEBE KAZUHIDE;OKADA MITSUHIRO;CHIBA TAKASHI;OGAWA ATSUSHI
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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