摘要 |
A method and device for the monitoring of a manufacturing process of a plurality of physical objects are disclosed. A method for the monitoring of a manufacturing process of a plurality of physical objects in which a statistical analysis is performed by using values of at least one process parameter of the manufacturing process of the physical object. Furthermore, in the case of the method, when they do not satisfy a prescribed selection criterion as a result of the statistical analysis, physical objects are marked in such a way that the associated physical objects are to be sent for special treatments.
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