发明名称 |
SONOS MEMORY DEVICE HAVING MEMORY NODE LAYER WITH NANO-CRYSTALLINE LAYER |
摘要 |
PURPOSE: An SONOS(Silicon-Oxide-Nitride-Oxide-Silicon) memory device is provided to improve substantially the degree of integration within the same design rules by writing more data in the same than a conventional unit cell using memory node layers with a nano-crystalline layer. CONSTITUTION: A memory device includes a memory type transistor with a gate(48) of an SONOS structure. The gate is formed on a semiconductor substrate(40). The gate is composed of a tunneling oxide layer(48a), a plurality of node layers(48c,48d,48f) on the tunneling oxide layer, and a gate electrode(48g) on the uppermost node layer. A crystalline layer(48b,48e) is selectively formed in the plurality of node layers. The crystalline layer is made of a plurality of nano-sized crystals for trapping the charges passed through the tunneling oxide layer, wherein the nano-sized crystals are spaced apart from each other.
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申请公布号 |
KR20040099802(A) |
申请公布日期 |
2004.12.02 |
申请号 |
KR20030031909 |
申请日期 |
2003.05.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHAE, SU DU;JUNG, YEON SEOK;KIM, JEONG U;KIM, JU HYEONG |
分类号 |
H01L21/8247;H01L21/28;H01L27/108;H01L27/115;H01L29/423;H01L29/51;H01L29/788;H01L29/792;(IPC1-7):H01L27/108 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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