| 摘要 |
A method and apparatus for generating bits for a diagnostic routine of a memory subsystem. A memory device may be divided into n subdivisions of m bits each. Alternatively, n memory devices may each have m bits (in width). The system may also have a cache line having a certain number of check words. A diagnostic routine may begin with the generating one of 2<m >bit patterns and assigning m bits of the generated bit pattern to one of the check words in the cache line. Each of the m bits assigned to the check word in the cache line may have the same logic value. However, each bit of the n subdivisions may be associated with a different check word in the cache line with respect to other bits of the subdivision. The method may be repeated for each of the 2<m >bit patterns that may be generated.
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