发明名称 OPTICAL MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an optical measuring apparatus with high accuracy utilizing evanescent light. SOLUTION: A photonic crystal 107 is set on a measurement surface, which comes in contact with an object to be measured 108, of an optical element 103 emitting the evanescent light 109. The group velocity of measuring light 106 is decreased near the measurement surface because of a photonic band structure made up by the photonic crystal 107. As a result, a period of interaction between the evanescent light 109 and the object to be measured 108 is made longer, thereby detecting more signals representing material information of the object to be measured, even by utilizing the evanescent light 109 which is essentially weak. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004340797(A) 申请公布日期 2004.12.02
申请号 JP20030138846 申请日期 2003.05.16
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ORITA KENJI;TAKIGAWA SHINICHI
分类号 G01N21/27;(IPC1-7):G01N21/27 主分类号 G01N21/27
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