发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To reduce an area occupied for integration by a plurality of elements by forming the elements in a limited area, so as to promote miniaturization of a display pixel pitch, which accompanies higher definition (increase in the number of pixels) and further reduction in the size of a device in the future. SOLUTION: A substrate is doped being inclined by 30-60°with respect to a direction of irradiation to form a self-aligned impurity region (Lov) of low concentration that overlaps a gate electrode, and thus to form a TFT having a GOLD (gate-drain overlapped lightly doped drain) structure. The length of the low concentration impurity region (Lov), in a longitudinal direction of a channel, that overlaps the gate electrode may be 20-150nm, preferably, 50-120nm. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004342936(A) 申请公布日期 2004.12.02
申请号 JP20030139424 申请日期 2003.05.16
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 NAKAMURA OSAMU;YAMAZAKI SHUNPEI
分类号 G02F1/1368;H01L21/20;H01L21/265;H01L21/336;H01L29/786;H01L51/50;H05B33/14;(IPC1-7):H01L21/336;G02F1/136 主分类号 G02F1/1368
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