| 摘要 |
PROBLEM TO BE SOLVED: To inspect an optoelectronic device substrate, which is used for an optoelectronic device such as a liquid crystal device or the like, using test element groups (TEG) even though after the produce is completed or mounted. SOLUTION: An optoelectronic device substrate (200) is provided with a substrate (210), at least one of the wiring, electrodes and electronic elements for image display formed in an image display region (10a), a plurality of external circuit connection terminals (102) which are arranged within a first region (401) that is located and arranged at the center of the side in the peripheral region of the substrate and TEG (300) which are arranged within second regions (402) located in the peripheral region along the first region. COPYRIGHT: (C)2005,JPO&NCIPI |
