| 摘要 |
PROBLEM TO BE SOLVED: To provide a spring probe and an IC socket which makes it possible to maintain the length of a coil spring even when a barrel is shortened so as to contract an overall length of the probe, for the spring probe used for the IC socket, in the IC socket and the spring probe used in an electric inspection of a semiconductor device like a LSI. SOLUTION: The spring probe comprises a barrel 9 made of a conductive material; a plunger 12T getting in touch with an external connection terminal of the LSI to be inspected, and a plunger 12B getting in touch with the external connection terminal of a circuit board for the inspection use; and a coil spring 10 which energizes the two plungers to the external direction. To at least one side of two plungers 12T and 12B, the concave clearance holes 13T and 13B which put in the coil spring 10 are set. When the barrel 9 is shortened, a portion of the coil spring 10 overflowing from the barrel is absorbed by the clearance holes 13T and 13B, it is not necessary to shorten the length of the coil spring 10, the original length is still used. COPYRIGHT: (C)2005,JPO&NCIPI |
